IP Library › Assignment 036198/0832
Patent Assignment
Reel/Frame 036198/0832

Assignment of Assignor's Interest

Recorded: 2015-07-28 Pages: 4
Assignors
WU, KENONG
Executed: 2014-01-31
GAO, LISHENG
Executed: 2014-02-03
CHEN, GRACE HSIU-LING
Executed: 2014-02-04
SHORTT, DAVID W.
Executed: 2014-02-11
Assignee
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Property (1)
Detecting Defects on a Wafer Using Defect-Specific and Multi-Channel Information
Patent: 9,552,636 →
Application: 14/811,409 →
Publication: US 2016/0027165