Patent Assignment
Reel/Frame 036225/0387
Assignment of Assignor's Interest
Recorded: 2015-07-31
Pages: 2
Assignors
OTANI, YUKO
Executed: 2015-06-16
UENO, TAKETO
Executed: 2015-06-18
NAKAYAMA, HIDEKI
Executed: 2015-06-16
HONDA, TOSHIFUMI
Executed: 2015-06-24
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property
(1)
Method and Device for Detecting Defects and Method and Device for Observing Defects
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.