IP Library › Assignment 036404/0102
Patent Assignment
Reel/Frame 036404/0102

Assignment of Assignor's Interest

Recorded: 2015-08-24 Pages: 3
Assignor
YAGI, ISAO
Executed: 2015-06-29
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property (1)
X-Ray Fluorescence Analyzer and Method of Displaying Sample Thereof
Patent: 9,829,447 →
Application: 14/833,665 →
Publication: US 2016/0061753
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0555 →
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0648 →