Patent Assignment
Reel/Frame 072903/0555
Change of Address
Recorded: 2025-09-17
Pages: 12
Assignor
HITACHI HIGH-TECH SCIENCE CORPORATION
Executed: 2020-02-12
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, 105-6411, JAPAN
Covered Properties
(50)
Charged Particle Beam Apparatus Having Improved Needle Movement Control
Thermal Analyzer
X-Ray Analyzer
Charged Particle Beam Apparatus
Focused Ion Beam Apparatus
Stabilized ICP Emission Spectrometer and method of using
Method for Measuring Vibration Characteristic of Cantilever
ICP Emission Spectrometer
Crystal Analysis Apparatus, Composite Charged Particle Beam Device, and Crystal Analysis Method
Cross-Section Processing and Observation Method and Cross-Section Processing and Observation Apparatus
X-Ray Fluorescence Analyzer
X-Ray Fluorescent Analyzer
Three-Dimensional Fine Movement Device
X-Ray Fluorescence Analyzer and Measurement Position Adjusting Method Therefore
Charged Particle Beam Apparatus
X-Ray Fluorescence Analyzer and Method of Displaying Sample Thereof
X-Ray Generator and Fluorescent X-Ray Analyzer
Charged Particle Beam Apparatus
Composite Charged Particle Beam Apparatus
X-Ray Fluorescence Analyzer
Radiation Analyzing Apparatus
Radiation Analyzing Apparatus
Sample Carrying Device and Vacuum Apparatus
X-Ray Analyzer
Sample Processing Evaluation Apparatus
Two-Dimensional Liquid Chromatographic Analyzer and Analytical Method
Cross-Section Processing-and-Observation Method and Cross-Section Processing-and-Observation Apparatus
Microsample Stage and Method of Manufacturing the Same
Sample Holder and Sample Holder Set
X-Ray Transmission Inspection Apparatus and Inspection Method Using the Same
X-Ray Analysis Device
Scanning Probe Microscope and Optical Axis Adjustment Method for Scanning Probe Microscope
Focused Ion Beam Apparatus
Method for Acquiring Image and Ion Beam Apparatus
Sample Positioning Method and Charged Particle Beam Apparatus
Automatic Sample Preparation Apparatus
Evolved Gas Analyzer and Method for Analyzing Evolved Gas
Charged Particle Beam Apparatus
Focused Ion Beam Apparatus
Radiation Analyzing Apparatus and Radiation Analyzing Method
Method for Cross-Section Processing and Observation and Apparatus Therefor
Sample Holder and Focused Ion Beam Apparatus
Sample Container and Thermal Analyzer
Charged Particle Beam Apparatus
Control Device, Charged Particle Beam Apparatus, Program and Method for Producing Processed Product
Scanning Probe Microscope and Probe Contact Detection Method
Charged Particle Beam Apparatus and Plasma Ignition Method
Liquid Chromatograph and Method for Correcting Detector Output Value Fluctuation of Liquid Chromatograph
Ion Beam System
X-Ray Transmission Inspection Apparatus
Related Assignments
(17)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Mar 13, 2015
From: NISHIMURA, SHINYA; FUJIWARA, HIROHITO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 035162/0507 →
Assignment of Assignor's Interest
Mar 23, 2015
From: SATO, MAKOTO; ASAHATA, TATSUYA; KIYOHARA, MASAHIRO; NAKATANI, IKUKO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 035230/0695 →
Assignment of Assignor's Interest
Mar 26, 2015
From: NAKAGAWA, YOSHITOMO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 035261/0209 →
Assignment of Assignor's Interest
Mar 31, 2015
From: MATSUZAWA, OSAMU
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 035299/0238 →
Assignment of Assignor's Interest
Apr 16, 2015
From: SHIGENO, MASATSUGU; SHIKAKURA, YOSHITERU
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 035429/0424 →
Assignment of Assignor's Interest
Jun 10, 2015
From: TAKAHASHI, HARUO; HIROSE, RYUSUKE; YAGI, ISAO; TAKAHARA, TOSHIYUKI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 035817/0774 →
Assignment of Assignor's Interest
Jul 7, 2015
From: SAKUTA, MASAHIRO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 036005/0387 →
Assignment of Assignor's Interest
Jul 9, 2015
From: SHIGENO, MASATSUGU; WATANABE, KAZUTOSHI; WATANABE, MASAFUMI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 036043/0300 →
Assignment of Assignor's Interest
Jul 21, 2015
From: YAGI, ISAO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 036146/0888 →
Assignment of Assignor's Interest
Aug 24, 2015
From: YAGI, ISAO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 036404/0102 →
Assignment of Assignor's Interest
Aug 27, 2015
From: HIROSE, RYUSUKE; TAKAHASHI, HARUO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 036441/0390 →
Assignment of Assignor's Interest
Nov 2, 2015
From: UEMOTO, ATSUSHI; ASAHATA, TATSUYA; SUZUKI, HIDEKAZU; YAMAMOTO, YO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 036934/0418 →
Assignment of Assignor's Interest
Dec 1, 2015
From: ASAHATA, TATSUYA; SUZUKI, HIDEKAZU; SATO, MAKOTO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 037180/0618 →
Assignment of Assignor's Interest
Jun 15, 2016
From: HIROSE, RYUSUKE
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 038923/0271 →
Assignment of Assignor's Interest
Jul 14, 2016
From: YAMAMOTO, YO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 039157/0831 →
Assignment of Assignor's Interest
Jul 14, 2016
From: TOMIMATSU, SATOSHI; SATO, MAKOTO; UEMOTO, ATSUSHI; ASAHATA, TATSUYA
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 039157/0795 →
Change of Name
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0648 →