Charged particle beam apparatus
A charged particle beam apparatus is provided with a controller configured to control other components and perform operations including: an irradiating operation to irradiate a first position of a sample with a charged particle beam while gradually changing a scan range of the charged particle beam to move from a first position; a first image acquiring operation to acquire an image of each portion where the charged particle beam moves; an indicator forming operation to form an indicator at a second position by the charged particle beam when the scan range of the charged particle beam reaches the second position; a second image acquiring operation to acquire an image of the second position in a state where the indicator is formed; and an adjusting operation to adjust relative position between the stage and the scan range of the charged particle beam.
1. A charged particle beam apparatus comprising:
a stage configured to hold a sample and to be movable;
a charged particle beam irradiation unit configured to irradiate the sample with a charged particle beam;
an image acquiring unit configured to detect secondary electrons generated from the sample due to the irradiation with the charged particle beam and to acquire images of the sample; and
a controller configured to control the charged particle beam apparatus and perform operations comprising:
an irradiating operation to irradiate a first position of the sample with the charged particle beam while changing a scan range of the charged particle beam such that the scan range of the charged particle beam moves from the first position;
a first image acquiring operation to control the image acquiring unit to acquire an image of each portion where the charged particle beam moves;
an indicator forming operation to form an indicator at a second position by the charged particle beam when the scan range of the charged particle beam reaches the second position;
a second image acquiring operation to control the image acquiring unit to acquire an image of the second position in a state where the indicator is formed; and
an adjusting operation to adjust a relative position between the stage and the scan range of the charged particle beam.
2. The charged particle beam apparatus according to claim 1 further comprising:
a display configured to display the images acquired by the image acquiring unit.
3. The charged particle beam apparatus according to claim 1 ,
wherein predetermined repetitive patterns are formed on the sample, and
wherein the controller performs a displaying operation to display the count values of the repetitive patterns within the images acquired by the image acquiring unit.
4. The charged particle beam apparatus according to claim 1 ,
wherein the second position is set according to a variable range of the scan range of the charged particle beam.
5. The charged particle beam apparatus according to claim 1 ,
wherein predetermined repetitive patterns are formed on the sample, and
wherein the second position is set according to the number of repetitive patterns of each pattern array.
6. The charged particle beam apparatus according to claim 1 further comprising:
a gas supplying unit configured to supply a deposition gas onto the sample,
wherein the indicator is formed by deposition using the charged particle beam while the deposition gas is supplied by the gas supplying unit.
7. The charged particle beam apparatus according to claim 1 ,
wherein the controller performs control of the charged particle beam to return the scan range of the charged particle beam to the first position after adjustment of a position of the stage.
8. The charged particle beam apparatus according to claim 1 ,
wherein the controller performs control of the charged particle beam to form the indicator at a position corresponding to a central part of the image in which the indicator image is included.