IP Library Granted Patent US 10,054,555
Granted Patent B2
US 10,054,555 · App. 15/220,880 · Granted Aug 21, 2018

X-ray transmission inspection apparatus and inspection method using the same

Inventors: Yoshiki Matoba (Tokyo, JP); Akihiro Takeda (Tokyo, JP); Shingo Tsuboi (Tokyo, JP); Toshihiro Sakai (Tokyo, JP)
Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
G01N23/04G01N2223/50G01N2223/652G01S17/08
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Quick Facts
Patent No.
US 10,054,555
App. No.
15/220,880
Granted
Aug 21, 2018
Kind
B2
Abstract

Disclosed are an X-ray transmission inspection apparatus and an inspection method using the same that are capable of preventing over-detection and erroneous detection of foreign matter even when variations in vertical position of the sample occur. The X-ray transmission inspection apparatus includes: an X-ray source ( 2 ) irradiating a sample with X-rays; a sample moving device ( 3 ) moving the sample S continuously to a predetermined direction while X-rays X are emitted from the X-ray source; a time delay integration sensor (TDI sensor) ( 4 ) provided opposed to the X-ray source based on the sample, and detecting the X-rays transmitted through the sample; a distance sensor ( 5 ) measuring a distance between the X-ray source and the sample; and a TDI controller ( 6 ) controlling the TDI sensor by changing a charge transfer speed of the TDI sensor ( 4 ) in real time based on variations in the distance measured by the distance sensor.

Claims (18)

1. An X-ray transmission inspection apparatus comprising:

an X-ray source irradiating a sample with X-rays;

a sample moving device moving the sample continuously in predetermined direction while X-rays are emitted from the X-ray source;

a time delay integration sensor (TDI sensor) provided opposed to the X-ray source with respect to the sample, and detecting the X-rays transmitted through the sample;

a distance sensor measuring a distance between the X-ray source and the sample; and

a TDI controller controlling the TDI sensor by changing a charge transfer speed of the TDI sensor in real time based on variations in the distance measured by the distance sensor.

2. The X-ray transmission inspection apparatus of claim 1 , wherein

the sample is in a band shape, and

the distance sensor is a laser distance sensor configured to measure the distance based on reflection of a laser beam projected onto the sample, wherein the laser beam is projected onto the sample in a direction crossing a moving direction of the sample and in a linear spot shape extending in a width direction of the sample.

3. An X-ray transmission inspection method comprising:

irradiating a sample with X-rays generated from an X-ray source

moving the sample continuously in a predetermined direction while X-rays are emitted from the X-ray source;

detecting the X-rays transmitted through the sample using a time delay integration sensor (TDI sensor) provided opposed to the X-ray source with respect to the sample;

measuring a distance between the X-ray source and the sample using a distance sensor; and

controlling the TDI sensor by changing a charge transfer speed of the TDI sensor in real time based on variations in the distance measured by the distance sensor.

4. The X-ray transmission inspection method of claim 3 , wherein

the sample is in a band shape, and

the distance sensor is a laser distance sensor configured to measure the distance based on reflection of a laser beam projected onto the sample, wherein the laser beam is projected onto the sample in a direction crossing a moving direction of the sample and in a linear spot shape extending in a width direction of the sample.

Assignments (3)
CHANGE OF ADDRESS Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0555 →
CHANGE OF NAME Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0648 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 27, 2016
From: MATOBA, YOSHIKI; TAKEDA, AKIHIRO; TSUBOI, SHINGO; SAKAI, TOSHIHIRO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 039273/0671 →
Priority Claims (1)
JP 2015-149138 · Jul 29, 2015 · national
Continuity (1)
Related Publication 20170031054A1 · Feb 2, 2017