IP Library Granted Patent US 10,242,842
Granted Patent B2
US 10,242,842 · App. 15/465,925 · Granted Mar 26, 2019

Method for cross-section processing and observation and apparatus therefor

Inventors: Xin Man (Tokyo, JP); Atsushi Uemoto (Tokyo, JP)
Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
H01J37/222G02B21/361H01J37/244H01J37/28H01J37/30H01J37/3178H01J2237/221H01J2237/226
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Quick Facts
Patent No.
US 10,242,842
App. No.
15/465,925
Granted
Mar 26, 2019
Kind
B2
Abstract

A method for cross-section processing and observation, and apparatus therefor, includes performing a position information obtaining process of observing the entirety of a sample by using an optical microscope or an electron microscope, and obtaining three-dimensional position coordinate information of a particular observation target object included in the sample; performing a cross-section processing process of irradiating a particular region in which the object is present by using a focused ion beam based on the information, and exposing a cross section of the region; performing a cross-section image obtaining process of irradiating the cross section by using an electron beam, and obtaining a cross-section image of a predetermined size region including the object; and performing a three-dimensional image obtaining process of repeating the cross-section processing process and the cross-section image obtaining process at predetermined intervals in a predetermined direction, and obtaining a three-dimensional image from the multiple cross-section images.

Claims (22)

1. A method for cross-section processing and observation, the method comprising:

a process of obtaining position information, by observing the entirety of a sample of observation target through a confocal stereoscopic microscope, obtaining an approximate three-dimensional position coordinate information of a particular observation target object included in the sample;

a process of cross-section processing, based on the three-dimensional position coordinate information, by irradiating a focused ion beam towards a particular region in which the particular observation target object is present in the sample, exposing a cross-section of the particular region;

a process of obtaining a cross-sectional image, by irradiating an electron beam on the cross-section, obtaining an image of a region of a predetermined size including the particular observation target object; and

a process of generating a three-dimensional image, by repeatedly performing the process of cross-section processing and the process of obtaining a cross-sectional image at predetermined intervals along a predetermined direction a plurality of times, constructing a three-dimensional image including the particular observation target object from a plurality of the cross-sectional images obtained.

2. The method of claim 1 , wherein plural kinds of the particular observation target objects are set, and the process of cross-section processing is performed on each of the particular observation target objects.

3. The method of claim 1 , wherein the process of obtaining a cross-sectional image comprises additionally obtaining a cross-sectional composite image of the particular region including the particular observation target object by detecting energy dispersive X-rays of the cross-section and the process of generating a three-dimensional image comprises constructing a three-dimensional composite image including the particular observation target object from a plurality of the cross sectional composite images obtained.

4. An apparatus for cross-section processing and observation, the apparatus comprising:

a sample stage on which a sample including a particular observation target object is placed;

a focused ion beam column that irradiates a focused ion beam on the sample;

an electron beam column that irradiates an electron beam on the sample;

an optical microscope column that optically observes the sample;

a secondary electron detector that detects secondary electrons generated from the sample or a back-scattered electron detector that detects back-scattered electrons;

an EDS detector for detecting characteristic X-rays generated from the sample; and

a control device configured to specify a location where the particular observation target object is present within the sample by observing the entirety of the sample using the optical microscope column and obtaining an approximate three-dimensional position coordinate information of the particular observation target object included in the sample, and construct a three-dimensional image of a particular region including the particular observation target object based on the three-dimensional position coordinate information and a three-dimensional composite image of the particular region.

5. A method for cross-section processing and observation, the method comprising:

a process of obtaining position information, by observing the entirety of a sample of observation target through an optical microscope or an electron microscope, obtaining an approximate three-dimensional position coordinate information of a particular observation target object included in the sample;

a process of cross-section processing, based on the three-dimensional position coordinate information, by irradiating a focused ion beam towards a particular region in which the particular observation target object is present in the sample, exposing a cross-section of the particular region;

a process of obtaining a cross-sectional image, by irradiating an electron beam on the cross-section, obtaining an image of a region of a predetermined size including the particular observation target object; and

a process of generating a three-dimensional image, by repeatedly performing the process of cross-section processing and the process of obtaining a cross-sectional image at predetermined intervals along a predetermined direction a plurality of times, constructing a three-dimensional image including the particular observation target object from a plurality of the cross-sectional images obtained,

wherein the process of obtaining a cross-sectional image comprises additionally obtaining a cross-sectional composite image of the particular region including the particular observation target object by detecting energy dispersive X-rays of the cross-section, and the process of generating a three-dimensional image comprises constructing a three-dimensional composite image including the particular observation target object from a plurality of the cross-sectional composite images obtained.

6. The method of claim 5 , wherein plural kinds of the particular observation target objects are set, and the process of cross-section processing is performed on each of the particular observation target objects.

Assignments (3)
CHANGE OF ADDRESS Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0555 →
CHANGE OF NAME Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0648 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 22, 2017
From: MAN, XIN; UEMOTO, ATSUSHI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 041681/0785 →
Priority Claims (2)
JP 2016-062512 · Mar 25, 2016 · national
JP 2017-053714 · Mar 17, 2017 · national
Continuity (1)
Related Publication 20170278668A1 · Sep 28, 2017
Cited By (1)
US 12,656,276