IP Library Granted Patent US 9,678,218
Granted Patent B2
US 9,678,218 · App. 14/994,196 · Granted Jun 13, 2017

Radiation analyzing apparatus

Inventors: Keiichi Tanaka (Tokyo, JP); Atsushi Nagata (Tokyo, JP)
Assignee: HITACHI HIGH-TECH SCIENCE Corporation
G01T1/1606G01T1/36
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Quick Facts
Patent No.
US 9,678,218
App. No.
14/994,196
Granted
Jun 13, 2017
Kind
B2
Abstract

A wave height analyzer generates pre-sensitivity correction data using a radiation pulse signal transmitted from a room temperature amplifier, a heater value acquired from a temperature control section, a base line of a current flowing to a TES acquired from a base line monitor mechanism. The wave height analyzer outputs the pre-sensitivity correction data to a sensitivity correction arithmetic operation unit and receives post-sensitivity correction data, on which sensitivity correction is performed. The wave height analyzer generates composite data of a combination of the pre-sensitivity correction data and the post-sensitivity correction data. A spectrum display section receives pieces of composite data sequentially created by the wave height analyzer and displays at least one of a spectrum before sensitivity correction and a spectrum after sensitivity correction, in response to receiving an operator's request.

Claims (14)

1. A radiation analyzing apparatus comprising:

a superconductive transition edge sensor configured to detect radiation and output a detection signal in accordance with sensitivity of the superconductive transition edge sensor;

a data acquisition unit configured to acquire a physical quantity of data having correlation with the sensitivity of the superconductive transition edge sensor;

a sensitivity correction unit configured to correct the detection signal output from the superconductive transition edge sensor by using information regarding the correlation between the physical quantity of data acquired by the data acquisition unit and the sensitivity of the superconductive transition edge sensor; and

a spectrum generation unit configured to generate an energy spectrum of the radiation based on the detection signal output from the superconductive transition edge sensor and a signal obtained by performing sensitivity correction on the detection signal by the sensitivity correction unit,

wherein the spectrum generation unit is configured to output signal data that includes the physical quantity of data and the detection signal output from the superconductive transition edge sensor, and

wherein the sensitivity correction unit is configured to, by using the signal data output from the spectrum generation unit, while generating the information regarding correlation between the physical quantity of data and the sensitivity of the superconductive transition edge sensor, correct the detection signal by using the information regarding correlation.

2. The radiation analyzing apparatus according to claim 1 , wherein the sensitivity correction unit is configured to, by using the signal data obtained over the period of time, repeatedly update the information regarding correlation for each period of time until a predetermined condition is satisfied.

3. The radiation analyzing apparatus according to claim 1 , wherein the data acquisition unit acquires an output of a heater, which is configured to heat the superconductive transition edge sensor, as the physical quantity.

4. The radiation analyzing apparatus according to claim 1 , wherein the data acquisition unit acquires a current flowing to the superconductive transition edge sensor as the physical quantity.

5. The radiation analyzing apparatus according to claim 1 , further comprising:

a display configured to display an energy spectrum of the radiation corresponding to each of presence and absence of sensitivity correction performed by the sensitivity correction unit.

6. The radiation analyzing apparatus according to claim 5 , wherein the display is configured to display the information regarding the correlation.

7. The radiation analyzing apparatus according to claim 5 , wherein the display is configured to display a setting screen for setting conditions for generating the information regarding correlation by the sensitivity correction unit, in response to receiving an operator's input.

Assignments (3)
CHANGE OF ADDRESS Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0555 →
CHANGE OF NAME Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0648 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 13, 2016
From: TANAKA, KEIICHI; NAGATA, ATSUSHI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 037473/0570 →
Priority Claims (1)
JP 2015-008548 · Jan 20, 2015 · national
Continuity (1)
Related Publication 20160231436A1 · Aug 11, 2016