IP Library Granted Patent US 9,719,949
Granted Patent B2
US 9,719,949 · App. 14/792,706 · Granted Aug 1, 2017

X-ray flourescent analyzer

Inventor: Masahiro Sakuta (Tokyo, JP)
Assignee: Hitachi High-Tech Science Corporation
G01N23/223G01N23/2204G01N35/00693G01N35/00732G01T7/12G01N2035/00702
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Quick Facts
Patent No.
US 9,719,949
App. No.
14/792,706
Granted
Aug 1, 2017
Kind
B2
Abstract

A sample plate is for X-ray analysis to which a sample is fixed in performing an analysis using an X-ray fluorescent analyzer, and includes: a plate-like body that supports the sample; and a code-indicated portion provided on the plate-like body in which information on the sample is encoded and indicated.

Claims (22)

1. An X-ray fluorescent analyzer comprising:

an X-ray tube that irradiates a sample with a primary X-ray;

a detector that detects a fluorescent X-ray emitted from the sample irradiated with the primary X-ray;

a sample stage on which a sample plate for X-ray analysis is installed, the sample plate including:

a plate-like body that supports the sample; and

a code-indicated portion provided on the plate-like body in which information on the sample is encoded and indicated;

an imaging unit that captures an image of the code-indicated portion; and

a code processor that operates to:

decode the information encoded in the code-indicated portion based on the image of the code-indicated portion captured by the imaging unit; and

update a calibration curve based on the decoded information.

2. The X-ray fluorescent analyzer according to claim 1 further comprising:

a sample stage moving mechanism that moves the sample stage; and

a controller that controls the sample stage moving mechanism,

wherein the controller controls the sample stage moving mechanism to move the sample stage and the sample supported by the sample plate to an X-ray irradiation area of the primary X-ray based on a position of the code-indicated portion determined from the image captured by the imaging unit.

3. The X-ray fluorescent analyzer according to claim 2 further comprising:

a display device that displays various types of information,

wherein when the sample is a standard material used for performing a quantitative elemental, the code-indicated portion includes information indicating that the sample is the standard material, and

wherein the controller controls the display device to display a warning when the information indicating that the sample is a standard material is not included in the information decoded by the code processor in measuring an element concentration of the standard material.

4. The X-ray fluorescent analyzer according to claim 1 , wherein the code-indicated portion is indicated as a two-dimensional code.

5. The X-ray fluorescent analyzer according to claim 1 , wherein when the sample is a standard material used for performing a quantitative elemental analysis, the code-indicated portion includes information indicating element concentration of the standard material.

6. The X-ray fluorescent analyzer according to claim 1 , wherein when the sample is a thickness standard foil used for performing film thickness measurement, the code-indicated portion includes information indicating thickness of the thickness standard foil.

7. The X-ray fluorescent analyzer according to claim 1 , wherein the code-indicated portion is provided on both front and rear faces of the plate-like body.

Assignments (3)
CHANGE OF ADDRESS Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0555 →
CHANGE OF NAME Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0648 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 7, 2015
From: SAKUTA, MASAHIRO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 036005/0387 →
Priority Claims (1)
JP 2014-140234 · Jul 8, 2014 · national
Continuity (1)
Related Publication 20160011129A1 · Jan 14, 2016