IP Library Granted Patent US 9,865,425
Granted Patent B2
US 9,865,425 · App. 15/193,922 · Granted Jan 9, 2018

Sample holder and sample holder set

Inventor: Kazunori Ando (Tokyo, JP)
Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
H01J37/20G02B21/00
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,865,425
App. No.
15/193,922
Granted
Jan 9, 2018
Kind
B2
Abstract

Disclosed herein is a sample holder which holds a sample such that a surface is exposed and can be mounted in each of multiple measurement devices that perform measurement based on different measurement principles so that properties of the sample can be measured by each of the measurement devices. The sample holder includes: a main body that surrounds the sample; alignment marks that are arranged at each of two or more different positions in a surface of the main body and can be detected by the measurement devices; and a sample-retaining portion that is disposed within the main body and retains the sample such that a height difference between a mark surface of the alignment mark and the surface of the sample is set to a predetermined value.

Claims (17)

1. A sample holder which holds a sample such that a surface of the sample is exposed and, can be mounted in each of multiple measurement devices that perform measurement based on different measurement principles respectively so that properties of the sample can be measured by each of the measurement devices, the sample holder comprising:

a main body that surrounds the sample;

alignment marks that are arranged at each of two or more different positions on a surface of the main body and can be detected by the measurement devices; and

a sample-retaining portion that is disposed within the main body and retains the sample such that a height difference between a mark surface of the alignment mark and the surface of the sample is set to a predetermined value,

wherein the height difference between the mark surface of the alignment mark and the surface of the sample is set within a range of a focal depth of the each of the measurement devices.

2. A sample holder set comprising:

a first sample holder which holds a sample such that a surface of the sample is exposed and, is mounted in a first measurement device of multiple measurement devices that perform measurement based on different measurement principles respectively so that properties of the sample can be measured; and

a second sample holder that holds the first sample holder holding the sample,

wherein the first sample holder includes a first main body that surrounds the sample, alignment marks that are disposed at each of two or more different positions in a surface of the first main body and can be detected by the first measurement device, and a first sample-retaining portion that is disposed within the first main body and retains the sample such that a height difference between a mark surface of the alignment mark and the surface of the sample is set to a predetermined value,

wherein the second sample holder includes a second main body that surrounds the first sample holder and a holder-retaining portion that is disposed within the second main body and holds the first sample holder, and

wherein among the multiple measurement devices, the sample holder set is mounted in a second measurement device that has a larger measurement field of view than the first measurement device and the alignment marks are detected, thereby enabling measurement of the sample.

3. A sample holder set comprising:

a first sample holder which holds a sample such that a surface of the sample is exposed and, is mounted in a first measurement device of multiple measurement devices that perform measurement based on different measurement principles respectively so that properties of the sample can be measured; and

a second sample holder that holds the first sample holder holding the sample,

wherein the first sample holder includes a first main body that surrounds the sample, first alignment marks that are disposed at each of two or more different positions in a surface of the first main body and can be detected by the first measurement device, and a first sample-retaining portion that is disposed within the first main body and retains the sample such that a height difference between a mark surface of the first alignment mark and the surface of the sample is set to a predetermined value,

wherein the second sample holder includes a second main body surrounding the first sample holder, second alignment marks that are disposed at each of two or more different positions in a surface of the second main body, and a holder-retaining portion that is disposed within the second main body and retains the first sample holder, and

wherein among the multiple measurement devices, the sample holder set is mounted in a second measurement device that has a larger measurement field of view than the first measurement device and the second measurement marks are detected, thereby enabling measurement of the sample.

Assignments (3)
CHANGE OF ADDRESS Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0555 →
CHANGE OF NAME Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0648 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 27, 2016
From: ANDO, KAZUNORI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 039020/0893 →
Priority Claims (1)
JP 2015-171867 · Sep 1, 2015 · national
Continuity (1)
Related Publication 20170062175A1 · Mar 2, 2017