Patent Assignment
Reel/Frame 036505/0642
Assignment of Assignor's Interest
Recorded: 2015-09-08
Pages: 5
Assignors
WON, HYOSIG
Executed: 2015-08-17
HYUN, DAIJOON
Executed: 2015-08-17
JEONG, KWANGOK
Executed: 2015-08-17
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129 SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 443-742, KOREA, REPUBLIC OF
Covered Property
(1)
Semiconductor Device for Testing Large Number of Devices and Composing Method and Test Method Thereof