Patent Assignment
Reel/Frame 036537/0097
Assignment of Assignor's Interest
Recorded: 2015-09-10
Pages: 4
Assignor
FROSIEN, JÜRGEN, DR.
Executed: 2015-09-07
Assignee
ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FÜR HALBLEITERPRÜFTECHNIK MBH
AMMERTHALSTR. 20, HEIMSTETTEN, D-85551, GERMANY
Covered Property
(1)
Charged Particle Beam Device and Method for Inspecting and/or Imaging a Sample