IP Library › Assignment 036548/0120
Patent Assignment
Reel/Frame 036548/0120

Assignment of Assignor's Interest

Recorded: 2015-09-12 Pages: 6
Assignors
SHIBATA, YUKIHIRO
Executed: 2015-07-28
FUKUSHIMA, HIDEKI
Executed: 2015-07-31
URANO, YUTA
Executed: 2015-07-31
HONDA, TOSHIFUMI
Executed: 2015-08-04
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property (1)
Defect Inspection Method and Device Using Same
Patent: 9,329,137 →
Application: 14/773,315 →
Publication: US 2016/0011123
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →