Patent Assignment
Reel/Frame 036548/0139
Assignment of Assignor's Interest
Recorded: 2015-09-12
Pages: 2
Assignors
TAKAGI, YUJI
Executed: 2015-06-24
HARADA, MINORU
Executed: 2015-06-24
SAKAMOTO, MASASHI
Executed: 2015-06-24
HIRAI, TAKEHIRO
Executed: 2015-06-28
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property
(1)
Defect Inspection Method and Defect Inspection Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.