Patent Assignment
Reel/Frame 036759/0372
Assignment of Assignor's Interest
Recorded: 2015-10-08
Pages: 2
Assignor
OGURA, TOSHIHIKO
Executed: 2015-09-28
Assignee
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
3-1, KASUMIGASEKI 1-CHOME, CHIYODA-KU, TOKYO, 100-8921, JAPAN
Covered Property
(1)
Sample Holder for Scanning Electron Microscope, Scanning Electron Microscope Image Observation System, and Scanning Electron Microscope Image Observation Method