IP Library Assignment 036873/0066
Patent Assignment
Reel/Frame 036873/0066

Assignment of Assignor's Interest

Recorded: 2015-10-23 Pages: 6
Assignors
SMILDE, HENDRIK JAN HIDDE
Executed: 2012-01-04
BLEEKER, ARNO JAN
Executed: 2012-01-09
COENE, WILLEM MARIE JULIA MARCEL
Executed: 2012-01-11
KUBIS, MICHAEL
Executed: 2012-01-10
WARNAAR, PATRICK
Executed: 2012-01-02
Assignee
ASML NETHERLANDS B.V.
DE RUN 6501, VELDHOVEN, NL - 5504 DR, NETHERLANDS
Covered Property (1)
Metrology Method and Inspection Apparatus, Lithographic System and Device Manufacturing Method
Patent: 9,946,167 →
Application: 14/824,696 →
Publication: US 2016/0033877