IP Library › Assignment 036916/0494
Patent Assignment
Reel/Frame 036916/0494

Assignment of Assignor's Interest

Recorded: 2015-10-29 Pages: 3
Assignor
SHI, LEI
Executed: 2015-10-28
Assignee
NANTONG FUJITSU MICROELECTRONICS CO., LTD.
NO. 288, CHONGCHUAN ROAD, NANTONG, 226006, CHINA
Covered Property (1)
Testing Probe and Semiconductor Testing Fixture, and Fabrication Methods Thereof
Application: 14/926,961 →
Publication: US 2016/0124017
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jan 17, 2017
From: NANTONG FUJITSU MICROELECTRONICS CO., LTD.
To: TONGFU MICROELECTRONICS CO., LTD.
Reel/Frame 041381/0374 →