IP Library › Assignment 036969/0120
Patent Assignment
Reel/Frame 036969/0120

Assignment of Assignor's Interest

Recorded: 2015-11-05 Pages: 2
Assignors
KOBAYASHI, KINYA
Executed: 2013-01-07
YOKOSUKA, TOSHIYUKI
Executed: 2013-01-10
LEE, CHAHN
Executed: 2013-01-10
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Electron Beam Irradiation Method and Scanning Electronic Microscope
Patent: 9,257,259 →
Application: 13/807,577 →
Publication: US 2013/0187045
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →