Patent Assignment
Reel/Frame 037316/0519
Assignment of Assignor's Interest
Recorded: 2015-12-17
Pages: 6
Assignors
ZHANG, LIN
Executed: 2014-12-16
SHENG, SHURAN
Executed: 2014-12-16
LE, ANDREW V.
Executed: 2014-12-16
Assignee
APPLIED MATERIALS, INC.
3050 BOWERS AVENUE, SANTA CLARA, CALIFORNIA, 95054
Covered Property
(1)
Multi-Function X-Ray Metrology Tool for Production Inspection/Monitoring of Thin Films and Multidimensional Structures