IP Library Assignment 037401/0765
Patent Assignment
Reel/Frame 037401/0765

Assignment of Assignor's Interest

Recorded: 2016-01-04 Pages: 2
Assignor
KONOMI, KENJI
Executed: 2015-12-15
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8001, JAPAN
Covered Property (1)
Verification Method of Mask Pattern, Manufacturing Method of a Semiconductor Device and Nontransitory Computer Readable Medium Storing a Mask Pattern Verification Program
Patent: 9,881,121 →
Application: 14/979,668 →
Publication: US 2017/0068770
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jul 5, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043088/0620 →
Merger Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
Change of Name and Address Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
Change of Name and Address Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →