IP Library › Assignment 037767/0444
Patent Assignment
Reel/Frame 037767/0444

Assignment of Assignor's Interest

Recorded: 2016-02-18 Pages: 2
Assignors
OMINAMI, YUSUKE
Executed: 2015-12-26
NISHIMURA, MASAKO
Executed: 2015-12-28
KAWANISHI, SHINSUKE
Executed: 2015-12-25
SUZUKI, HIROYUKI
Executed: 2015-12-25
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged Particle Beam Apparatus and Sample Image Acquiring Method
Patent: 9,741,526 →
Application: 14/912,521 →
Publication: US 2016/0203944
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →