IP Library › Assignment 037854/0541
Patent Assignment
Reel/Frame 037854/0541

Assignment of Assignor's Interest

Recorded: 2016-02-29 Pages: 4
Assignors
IWAHASHI, YOHEI
Executed: 2015-12-11
SENDA, HIDEMI
Executed: 2015-12-08
Assignee
TOYOTA JIDOSHA KABUSHIKI KAISHA
1, TOYOTA-CHO, TOYOTA-SHI, AICHI-KEN, 471-8571, JAPAN
Covered Property (1)
Inspection Method for Semiconductor Substrate, Manufacturing Method of Semiconductor Device and Inspection Device for Semiconductor Substrate
Patent: 9,753,082 →
Application: 15/055,200 →
Publication: US 2016/0252571
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 1, 2020
From: TOYOTA JIDOSHA KABUSHIKI KAISHA (AKA TOYOTA MOTOR CORPORATION)
To: DENSO CORPORATION
Reel/Frame 052280/0207 →