IP Library › Assignment 037861/0860
Patent Assignment
Reel/Frame 037861/0860

Assignment of Assignor's Interest

Recorded: 2016-03-01 Pages: 3
Assignors
YASUDA, KENICHI
Executed: 2016-02-18
ARAI, SHINYA
Executed: 2016-02-18
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8001, JAPAN
Covered Property (1)
Forming Method of Superposition Checking Mark, Manufacturing Method of a Semiconductor Device and Semiconductor Device
Patent: 9,881,874 →
Application: 15/057,406 →
Publication: US 2017/0154852
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jul 5, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043088/0620 →
Merger Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
Change of Name and Address Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
Change of Name and Address Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →