Patent Assignment
Reel/Frame 038126/0798
Assignment of Assignor's Interest
Recorded: 2016-03-29
Pages: 7
Assignors
KIM, SOUK
Executed: 2016-02-15
JUN, CHUNG-SAM
Executed: 2016-02-16
KO, WOO-SEOK
Executed: 2016-03-19
LEE, SANG-KIL
Executed: 2016-03-04
SHIN, KWANG-IL
Executed: 2016-02-15
YANG, YU-SIN
Executed: 2016-02-16
YOON, MIN-CHUL
Executed: 2016-02-16
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Method of Inspecting Wafer Using Electron Beam