Patent Assignment
Reel/Frame 038196/0530
Assignment of Assignor's Interest
Recorded: 2016-04-05
Pages: 6
Assignors
GHASSEMI, HESSAM
Executed: 2016-03-29
LANG, ANDREW C.
Executed: 2016-03-23
TAHERI, MITRA L.
Executed: 2016-03-29
Assignee
DREXEL UNIVERSITY
3141 CHESTNUT STREET, PHILADELPHIA, PENNSYLVANIA, 19104
Covered Properties
(2)
Accelerated Failure Test of Coupled Device Structures Under Direct Current Bias
Accelerated Failure Test of Coupled Device Structures Under Direct Current Bias
Application:
62/143,519 →
Related Assignments
(2)
Other recorded transfers of the patents in this record — the chain of ownership.