Patent Assignment
Reel/Frame 038230/0964
Assignment of Assignor's Interest
Recorded: 2016-04-08
Pages: 6
Assignors
SHIBAHARA, SHINICHI
Executed: 2016-03-07
KAWAKAMI, DAISUKE
Executed: 2016-03-07
IGAKU, YUTAKA
Executed: 2016-03-16
Assignee
RENESAS ELECTRONICS CORPORATION
2-24, TOYOSU 3-CHOME, KOUTOU-KU, TOKYO, 135-0061, JAPAN
Covered Property
(1)
Semiconductor Apparatus and Diagnostic Test Method