Patent Assignment
Reel/Frame 038929/0378
Assignment of Assignor's Interest
Recorded: 2016-06-16
Pages: 7
Assignors
KIM, HYUNWOO
Executed: 2015-05-29
KO, WOOSEOK
Executed: 2015-05-19
KIM, MINKOOK
Executed: 2015-05-12
KIM, JUNG HWAN
Executed: 2015-05-12
YANG, YUSIN
Executed: 2015-05-19
LEE, SANGKIL
Executed: 2015-05-19
JUN, CHUNGSAM
Executed: 2015-05-20
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129 SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Semiconductor Inspection System and Methods of Inspecting a Semiconductor Device Using the Same