Patent Assignment
Reel/Frame 039018/0501
Nunc Pro Tunc Assignment
Recorded: 2016-06-27
Pages: 14
Assignors
YUN, WENBING
Executed: 2016-06-15
LEWIS, SYLVIA JIA YUN
Executed: 2016-06-15
KIRZ, JANOS
Executed: 2016-06-15
Assignee
SIGRAY, INC.
5750 IMHOFF DR., SUITE I, CONCORD, CALIFORNIA, 94520
Covered Properties
(2)
X-Ray Techniques Using Structured Illumination
X-Ray Microdiffraction with Structured Illumination for Strain Measurement in Nanoelectronics
Application:
62/343,594 →