Patent Assignment
Reel/Frame 039265/0482
Assignment of Assignor's Interest
Recorded: 2016-07-27
Pages: 3
Assignee
RENESAS ELECTRONICS CORPORATION
2-24, TOYOSU 3-CHOME, KOUTOU-KU,, TOKYO, 135-0061, JAPAN
Covered Property
(1)
Test Point Circuit, Scan Flip-Flop for Sequential Test, Semiconductor Device and Design Device