Patent Assignment
Reel/Frame 039283/0016
Assignment of Assignor's Interest
Recorded: 2016-07-28
Pages: 2
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Method of Improving Quality of Scanning Charged Particle Microscope Image, and Scanning Charged Particle Microscope Apparatus
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.