Patent Assignment
Reel/Frame 039478/0229
Assignment of Assignor's Interest
Recorded: 2016-08-18
Pages: 2
Assignee
FREESCALE SEMICONDUCTOR, INC.
6501 WILLIAM CANNON DRIVE WEST, AUSTIN, TEXAS, 78735
Covered Property
(1)
System and Method for Characterizing Critical Parameters Resulting from a Semiconductor Device Fabrication Process
Application:
15/240,701 →
Publication:
US 2018/0053698
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.