IP Library Assignment 039875/0130
Patent Assignment
Reel/Frame 039875/0130

Assignment of Assignor's Interest

Recorded: 2016-09-28 Pages: 2
Assignors
AKIMA, HISANAO
Executed: 2016-09-10
YOSHIDA, TAKAHO
Executed: 2016-09-10
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged-Particle-Beam Device and Method for Correcting Aberration
Patent: 9,484,182 →
Application: 14/422,423 →
Publication: US 2015/0235801
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →