IP Library Assignment 039890/0508
Patent Assignment
Reel/Frame 039890/0508

Assignment of Assignor's Interest

Recorded: 2016-09-29 Pages: 4
Assignor
TAKENO, KENGO
Executed: 2016-09-20
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Sample Positioning Method and Charged Particle Beam Apparatus
Application: 15/279,096 →
Publication: US 2017/0092460
Related Assignments (5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 29, 2016
From: KIYOHARA, MASAHIRO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 039890/0472 →
Assignment of Assignor's Interest Sep 29, 2016
From: UMEMURA, KAORU
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 039890/0565 →
Assignment of Assignor's Interest Sep 29, 2016
From: UEMOTO, ATSUSHI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 039890/0662 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0555 →
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0648 →