IP Library Assignment 040152/0145
Patent Assignment
Reel/Frame 040152/0145

Assignment of Assignor's Interest

Recorded: 2016-10-27 Pages: 2
Assignors
GARRE, PHILIPPE
Executed: 2016-10-27
GARRE, SILVIA
Executed: 2016-10-27
Assignee
FREESCALE SEMICONDUCTOR, INC.
6501 WILLIAM CANNON DRIVE WEST, AUSTIN, TEXAS, 78735
Covered Property (1)
Microelectromechanical Systems Device Test System and Method
Application: 15/336,035 →
Publication: US 2018/0120126
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Merger Jan 3, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041144/0363 →
Assignment of Assignor's Interest Mar 10, 2026
From: NXP USA, INC.
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 075099/0657 →