IP Library Assignment 040370/0553
Patent Assignment
Reel/Frame 040370/0553

Assignment of Assignor's Interest

Recorded: 2016-11-18 Pages: 3
Assignors
NOOITGEDAGT, TJITTE
Executed: 2014-01-10
KEA, MARC JURIAN
Executed: 2014-01-10
Assignee
ASML NETHERLANDS B.V.
DE RUN 6501, VELDHOVEN, NL - 5504 DR, NETHERLANDS
Covered Property (1)
Inspection Methods, Substrates Having Metrology Targets, Lithographic System and Device Manufacturing Method
Patent: 9,958,790 →
Application: 15/105,349 →
Publication: US 2016/0327871