Patent Assignment
Reel/Frame 040715/0828
Assignment of Assignor's Interest
Recorded: 2016-12-12
Pages: 2
Assignors
OTANI, YUKO
Executed: 2016-11-04
URANO, YUTA
Executed: 2016-11-04
HONDA, TOSHIFUMI
Executed: 2016-11-04
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property
(1)
Defect Observation Method and Device and Defect Detection Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.