Patent Assignment
Reel/Frame 040755/0662
Assignment of Assignor's Interest
Recorded: 2016-12-22
Pages: 3
Assignor
IKEDA, HIROO
Executed: 2016-12-01
Assignee
NEC CORPORATION
7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, 108-8001, JAPAN
Covered Property
(1)
Abnormality Detection Device and Abnormality Detection Method