Patent Assignment
Reel/Frame 041065/0453
Assignment of Assignor's Interest
Recorded: 2017-01-24
Pages: 2
Assignors
UNUMA, MUNETOSHI
Executed: 2016-09-26
SAEKI, TAKASHI
Executed: 2016-09-12
YUDA, SHINYA
Executed: 2016-09-09
Assignee
HITACHI LTD.
6-6, MARUNOUCHI 1-CHOME, CHIYODA-KU, TOKYO, 100-8280, JAPAN
Covered Property
(1)
Device Degradation Cause Estimation Method and Device