IP Library Assignment 041150/0241
Patent Assignment
Reel/Frame 041150/0241

Assignment of Assignor's Interest

Recorded: 2017-02-01 Pages: 2
Assignors
SHINODA, SHINICHI
Executed: 2016-12-14
TOYODA, YASUTAKA
Executed: 2016-12-16
USHIBA, HIROYUKI
Executed: 2016-12-21
SUGAHARA, HITOSHI
Executed: 2016-12-20
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property (1)
Pattern Measurement Condition Setting Device and Pattern Measuring Device
Application: 15/321,667 →
Publication: US 2017/0160082
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →