Patent Assignment
Reel/Frame 041178/0061
RELEASE OF SECURITY INTEREST
Recorded: 2016-12-22
Received: 2016-12-22
Pages: 10
Assignor
MORGAN STANLEY SENIOR FUNDING, INC.
Executed: 2016-12-09
Assignees
CYPRESS SEMICONDUCTOR CORPORATION
198 CHAMPION COURT, SAN JOSE, CA, 95134, UNITED STATES
SPANSION LLC
198 CHAMPION COURT, SAN JOSE, CA, 95134, UNITED STATES
Covered Applications
(45)
FLOATING GATE MEMORY DEVICE WITH INCREASED COUPLING COEFFICIENT
App. No. 12/154,584
→
CIRCUIT AND METHOD TO INCREASE READ MARGIN IN NON-VOLATILE MEMORIES USING A DIFFERENTIAL SENSING CIRCUIT
App. No. 12/059,560
→
POWER SUPPLY VOLTAGE REGULATOR CIRCUIT AND MICROCOMPUTER
App. No. 12/043,506
→
DUMMY CELL FOR MEMORY CIRCUITS
App. No. 12/006,224
→
3T HIGH DENSITY NVDRAM CELL
App. No. 12/006,227
→
ARCHITECTURE OF A NVDRAM ARRAY AND ITS SENSE REGIME
App. No. 12/006,226
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DEVICE HAVING A PROTECTIVE CAP FORMED OVER AN ANTI-REFLECTIVE COATING LAYER AND OVER AN INSULATING MATERIAL
App. No. 11/781,551
→
Coupling coefficient for floating gate memory devices
App. No. 60/931,701
→
Method to Double The Read Margin in Non-Volatile Memories by Differential Sensing ARchitecture
App. No. 60/909,362
→
NON-VOLATILE, STATIC RANDOM ACCESS MEMORY WITH REGULATED ERASE SATURATION AND PROGRAM WINDOW
App. No. 11/644,196
→
VARIABLE IMPEDANCE SENSE ARCHITECTURE AND METHOD
App. No. 11/540,831
→
Non-volatile, static random access memory with regulated erase saturation and program window
App. No. 60/838,694
→
PULSE WIDTH MODULATION CIRCUIT
App. No. 11/494,620
→
Variable impedance sense architecture and method
App. No. 60/722,612
→
COMMUNICATION DATA CONTROLLER
App. No. 11/169,747
→
MICROCONTROLLER
App. No. 11/168,448
→
IMPEDANCE BUFFER AND METHOD
App. No. 11/138,823
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SIGNAL DETECTION METHOD, FREQUENCY DETECTION METHOD, POWER CONSUMPTION CONTROL METHOD, SIGNAL DETECTING DEVICE, FREQUENCY DETECTING DEVICE, POWER CONSUMPTION CONTROL DEVICE AND ELECTRONIC APPARATUS
App. No. 11/122,123
→
HIGH K STACK FOR NON-VOLATILE MEMORY
App. No. 11/086,310
→
Reference cell configuration for a 1T/1C ferroelectric memory
App. No. 10/993,202
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SEMICONDUCTOR CONTACT AND NITRIDE SPACER FORMATION SYSTEM AND METHOD
App. No. 10/934,923
→
Generic programmable impedance architecture for high speed output buffers
App. No. 60/598,360
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DC component cancellation circuit
App. No. 10/850,395
→
AVOIDING FIELD OXIDE GOUGING IN SHALLOW TRENCH ISOLATION (STI) REGIONS
App. No. 10/799,413
→
AMPLIFICATION CIRCUIT AND OPTICAL COMMUNICATION APPARATUS PROVIDED WITH THE AMPLIFICATION CIRCUIT
App. No. 10/418,174
→
COLUMN DECODER CONFIGURATION FOR A 1T/1C MEMORY
App. No. 10/389,276
→
REDUCED SILICON GOUGING AND COMMON SOURCE LINE RESISTANCE IN SEMICONDUCTOR DEVICES
App. No. 10/358,756
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PULSE WIDTH DETECTION CIRCUIT FILTERING THE INPUT SIGNAL AND GENERATING A BINARY SIGNAL
App. No. 10/327,094
→
MOCVD FORMATION OF CU2S
App. No. 10/305,889
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HARD MASK REMOVAL PROCESS INCLUDING ISOLATION DIELECTRIC REFILL
App. No. 10/165,837
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REPLACING A FIRST LINER LAYER WITH A THICKER OXIDE LAYER WHEN FORMING A SEMICONDUCTOR DEVICE
App. No. 10/126,841
→
ISOLATION TRENCH FILL PROCESS
App. No. 10/120,116
→
CONTACT STRUCTURE AND METHOD OF MAKING THE SAME
App. No. 10/112,572
→
METHOD FOR FORMING A SEMICONDUCTOR DEVICE WITH SELF-ALIGNED CONTACTS USING A LINER OXIDE LAYER
App. No. 10/109,526
→
PLANARIZATION OF A POLYSILICON LAYER SURFACE BY CHEMICAL MECHANICAL POLISH TO IMPROVE LITHOGRAPHY AND SILICIDE FORMATION
App. No. 10/067,765
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METHOD OF MANUFACTURING HIGH VOLTAGE TRANSISTOR WITH MODIFIED FIELD IMPLANT MASK
App. No. 10/044,510
→
METHOD OF DETERMINING GATE OXIDE THICKNESS OF AN OPERATIONAL MOSFET
App. No. 10/017,832
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INNOVATIVE METHOD OF HARD MASK REMOVAL
App. No. 10/045,354
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METHOD OF FORMING ZERO MARKS
App. No. 09/884,204
→
METHOD AND SYSTEM FOR QUALIFYING AN ONO LAYER IN A SEMICONDUCTOR DEVICE
App. No. 09/875,073
→
NON-VOLATILE STATIC MEMORY CELL
App. No. 09/871,172
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NAND STACK EEPROM WITH RANDOM PROGRAMMING CAPABILITY
App. No. 09/681,314
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METHOD FOR FABRICATING A CONDUCTIVE STRUCTURE FOR A SEMICONDUCTOR DEVICE
App. No. 09/805,287
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Method for forming self-aligned contacts and local interconnects for salicided gates using a secondary spacer
App. No. 09/799,469
→
SENSE AMPLIFIER CONFIGURATION FOR A 1T/1C FERROELECTRIC MEMORY
App. No. 09/764,223
→