IP Library › Assignment 041282/0747
Patent Assignment
Reel/Frame 041282/0747

Assignment of Assignor's Interest

Recorded: 2017-02-17 Pages: 2
Assignors
WATANABE, MASAFUMI
Executed: 2016-06-06
UENO, TOSHIHIRO
Executed: 2016-06-06
ITO, SUSUMU
Executed: 2016-06-06
HASEGAWA, SHOICHI
Executed: 2016-06-06
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Scanning Probe Microscope and Optical Axis Adjustment Method for Scanning Probe Microscope
Application: 15/249,474 →
Publication: US 2017/0059609
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0555 →
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0648 →