IP Library Assignment 041318/0763
Patent Assignment
Reel/Frame 041318/0763

Assignment of Assignor's Interest

Recorded: 2017-02-21 Pages: 6
Assignors
PETERS, JAN HENDRIK
Executed: 2017-02-02
BLUMRICH, JÖRG FREDERIK
Executed: 2017-02-01
SEIDEL, DIRK
Executed: 2017-02-01
Assignee
CARL ZEISS SMT GMBH
RUDOLF-EBER-STRASSE 2, OBERKOCHEN, 73447, GERMANY
Covered Property (1)
Method for Localizing Defects on Substrates
Application: 15/400,221 →
Publication: US 2017/0115557
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 21, 2017
From: HUSEMANN, CHRISTOPH
To: CARL ZEISS AG
Reel/Frame 041318/0967 →