IP Library Assignment 041318/0967
Patent Assignment
Reel/Frame 041318/0967

Assignment of Assignor's Interest

Recorded: 2017-02-21 Pages: 3
Assignor
HUSEMANN, CHRISTOPH
Executed: 2017-02-01
Assignee
CARL ZEISS AG
DEP. CLP-PS, OBERKOCHEN, 73446, GERMANY
Covered Property (1)
Method for Localizing Defects on Substrates
Application: 15/400,221 →
Publication: US 2017/0115557
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 21, 2017
From: PETERS, JAN HENDRIK; BLUMRICH, JÖRG FREDERIK; SEIDEL, DIRK
To: CARL ZEISS SMT GMBH
Reel/Frame 041318/0763 →