Patent Assignment
Reel/Frame 041540/0982
Assignment of Assignor's Interest
Recorded: 2017-01-27
Pages: 2
Assignors
MINEKAWA, YOHEI
Executed: 2016-11-07
TAKAGI, YUJI
Executed: 2016-11-01
HIRAI, TAKEHIRO
Executed: 2016-11-07
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property
(1)
Defect Quantification Method, Defect Quantification Device, and Defect Evaluation Value Display Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.