IP Library › Assignment 041728/0888
Patent Assignment
Reel/Frame 041728/0888

Assignment of Assignor's Interest

Recorded: 2017-03-24 Pages: 5
Assignors
SHIGENO, MASATSUGU
Executed: 2017-03-14
WATANABE, KAZUTOSHI
Executed: 2017-03-14
WATANABE, MASAFUMI
Executed: 2017-03-14
YAMAMOTO, HIROYOSHI
Executed: 2017-03-14
CHINONE, KAZUO
Executed: 2017-03-14
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Property (1)
Scanning Probe Microscope and Probe Contact Detection Method
Application: 15/468,668 →
Publication: US 2017/0285067
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0555 →
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0648 →