IP Library Assignment 041971/0785
Patent Assignment
Reel/Frame 041971/0785

Assignment of Assignor's Interest

Recorded: 2017-04-11 Pages: 9
Assignors
UPPALURI, PRASANTI
Executed: 2017-01-26
MANEPALLI, RAJESH
Executed: 2017-01-30
KULKARNI, ASHOK V.
Executed: 2017-02-16
BANERJEE, SAIBAL
Executed: 2017-03-13
KIRKLAND, JOHN
Executed: 2017-02-23
Assignee
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Property (1)
System and Method for Generation of Wafer Inspection Critical Areas
Application: 15/394,545 →
Publication: US 2018/0130195