IP Library Assignment 041987/0582
Patent Assignment
Reel/Frame 041987/0582

Assignment of Assignor's Interest

Recorded: 2017-04-12 Pages: 8
Assignors
PAPPU, LAKSHMINARAYANA
Executed: 2017-02-03
BHATT, SUKETU
Executed: 2017-01-04
CHELLAPPAN, SATHEESH
Executed: 2017-01-03
Assignee
INTEL CORPORATION
2200 MISSION COLLEGE BOULEVARD, SANTA CLARA, CALIFORNIA, 95054
Covered Property (1)
Device, System and Method for Providing on-Chip Test/Debug Functionality
Application: 15/394,666 →
Publication: US 2018/0188321
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 18, 2025
From: INTEL CORPORATION
To: SK HYNIX NAND PRODUCT SOLUTIONS CORP. (DBA SOLIDIGM)
Reel/Frame 072890/0093 →