IP Library Assignment 041997/0737
Patent Assignment
Reel/Frame 041997/0737

Assignment of Assignor's Interest

Recorded: 2017-04-13 Pages: 7
Assignors
TSUNO, NATSUKI
Executed: 2017-04-07
SUZUKI, NAOMASA
Executed: 2017-04-13
KAZUMI, HIDEYUKI
Executed: 2017-04-06
HOTTA, SHOJI
Executed: 2017-04-06
KIMURA, YOSHINOBU
Executed: 2017-04-07
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged Particle Beam Apparatus and Inspection Method Using the Same
Patent: 9,659,744 →
Application: 14/948,167 →
Publication: US 2016/0148781
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →