Patent Assignment
Reel/Frame 042153/0599
Assignment of Assignor's Interest
Recorded: 2017-04-26
Pages: 4
Assignors
OTANI, YUKO
Executed: 2017-04-11
TAKAGI, YUJI
Executed: 2017-04-11
NAKAYAMA, HIDEKI
Executed: 2017-04-11
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Defect Observation Method and Defect Observation Device
Application:
15/522,143 →
Publication:
US 2017/0328842
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.