Patent Assignment
Reel/Frame 042437/0686
Assignment of Assignor's Interest
Recorded: 2017-05-19
Pages: 3
Assignors
WU, KUAN-TE
Executed: 2017-05-11
LAI, JENN-SHIANG
Executed: 2017-05-11
LO, CHIH-YEN
Executed: 2017-05-11
LI, JIN-FU
Executed: 2017-05-11
Assignee
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
NO. 195, SEC. 4, CHUNG HSING RD.,, CHUTUNG, HSINCHU, 31040, TAIWAN
Covered Property
(1)
Memory Control Circuit and Memory Test Method